Publications

Dual beam-shear differential interference microscopy for full-field surface deformation gradient characterization

Published in Journal of the Mechanics and Physics of Solids, 2020

Recommended citation: Zeng, Z., Chiu, H. C., Zhao, L., Zhao, T., Zhang, C., Karami, M., Yu, H., Du, S. & Chen, X. (2020). Dual beam-shear differential interference microscopy for full-field surface deformation gradient characterization. Journal of the Mechanics and Physics of Solids, 104162. https://www.sciencedirect.com/science/article/pii/S002250962030394X